• 专利附录
  • 专利说明
  • 权利要求
  • 类似技术
  • 同族专利
  • 引用文献
  • 法律状态
  • 优先权
    • 专利摘要:
    The present invention relates to a test platform for high-frequency cable, comprising conductive contacts (30) and clamps (2) for pressing a conductor of the cable on a corresponding conductive contact, and comprising a separation seat (1). , which comprises an upper surface (10) and a plurality of varied sides (11, 12), the conductive contacts being respectively arranged on the sides, the clamps being disposed on a periphery of the separating seat and opposed to their corresponding conductive contact. The separating seat (1) is further provided with separating channels (13), each separating channel obliquely connecting the upper surface (10) to a corresponding side (11, 12). The present invention adopts a separating seat (1) having a polyhedral structure, which makes it possible to shorten the stripping length, and to prevent the vertical bending of the core, thereby reducing the deterioration of the cable structure to a greater extent , and in doing so can significantly increase the test frequency.
    公开号:CH710587B1
    申请号:CH01677/15
    申请日:2014-12-31
    公开日:2018-12-14
    发明作者:Zhang Cheng；Jiang Bin；Shen Nailian；Gong Jiangjiang；Yin Ying
    申请人:Shanghai Electric Cable Res Institute；Shanghai Secri Optical & Electric Cable Co Ltd；
    IPC主号:
    专利说明:

    Description: The present invention relates to a cable test system, and relates in particular to a test platform for a high frequency cable. In general, when performing a test of a cable containing several pairs of cores, it is necessary to strip the cable in order to expose a conductor of each core at its end, then these cores are accessible to the system of cable test via a connection device to carry out the test. The higher the test frequency, the shorter the required stripped length of the cable, and the higher the requirement for the integrity of the structure of the cable itself. Therefore, when performing high frequency test, high demands are made on the test platform for the high frequency cable. Conventional symmetric data cable tests are concentrated mainly in lower frequency ranges (mainly 1 ~ 350 MHz, 1 ~ 750 MHz). As with the high range test, the test is either performed on a pair of cores each time, or simultaneously performed on multiple pairs of cores at a relatively low frequency. In the first case, the mutual crosstalk between the multiple pairs of nuclei does not allow testing in this way and for the latter case, during a simultaneous test of the multiple pairs of nuclei, the full test of the data is still impractical, because that the outer sheath of the symmetrical data cable is too damaged by the wiring process.
    A Chinese utility model, CN 2 709 992 Y, discloses a cable testing platform which includes a plurality of cable clamps arranged along a circular arc. After the cable to be tested has been stripped, each core is separated in the form of a fan in the same plane and is inserted into each cable clamp along the radial direction of the arc of a circle to complete the wiring. Due to the restriction due to the structure of the collets, it is impossible to obtain a relatively small distance between two adjacent collets, resulting in the impossibility of a relatively small radius of the arc of a circle, that is, it is impossible to obtain a relatively short stripped length of the cable. As a result, the cable test frequency is limited and, in general, for the cable test platform having such a structure, the test frequency thereof cannot exceed 1 GHz.
    A Chinese patent application, 2008 10 200 066.X, disclosed a wiring plate for testing high frequency cables which comprises a plurality of clamps distributed uniformly over the periphery of the high frequency wiring body which has the shape of a disc. The cable to be tested is inserted through the center of the disc-shaped body in the direction perpendicular to the surface of the disc-shaped body, in order to bend each core vertically, so that all the cores are radially distributed in the same plane. , and be inserted into each clamp along the radial directions to complete the wiring. This structure makes it possible to shorten the stripped length of the cable, however, since the core is bent perpendicularly, the damage to the structure of the cable is relatively significant, and therefore the test frequency of the latter does not exceed approximately 1.2 GHz.
    In view of the above concerning the cable testing system according to the prior art, and since all the cores are arranged in the same plane for the test, the deterioration of the cable structure is relatively large and therefore the higher frequency test requirements cannot be met.
    The technical problem to be solved in the present invention is to provide a test platform for a high frequency cable, so as to reduce the damage to the cable structure, and to satisfy the frequency test requirements more high.
    In order to solve the technical problem mentioned above, the present invention adopts the following technical solution: a test platform for a high frequency cable, comprising conductive contacts and clamps for pressing a conductor of the cable against one of the corresponding conductive contacts, and further comprising a separation seat which includes an upper surface and a plurality of sides. The conductive contacts are respectively arranged on the sides, the clamps are arranged on a periphery of the separation seat and located opposite a corresponding conductive contact. The separation seat is furthermore provided with inclined separation channels which each connect the upper surface to a corresponding side.
    Preferably, each conductive contact is arranged below the upper surface of the separation seat, each separation channel is inclined outward and downward from the upper surface.
    Preferably, the upper surface of the separation seat is a regular polygon and the inscribed circle of this regular polygon has a smaller diameter than that of the cable.
    Preferably, each side of the separation seat is respectively arranged perpendicular to the upper surface.
    Preferably, each respective side of the separation seat is an inclined face, and the direction of inclination on each side corresponds to that of each separation channel.
    Preferably, the separation seat is covered on top by a shielding box, and the center of the shielding box is provided with a through hole in which the cable enters.
    Preferably, each clamp comprises a fixing base and a linear slide which can slide in the fixing base, a front end of the sliding element is provided with a clamping surface opposite the conductive contact, a rear end of the slide is hingedly connected to a front end of a connecting element via a first articulation point, the rear end of the connecting element is hinged to a part
    CH 710 587 B1 middle of a lever arm via a second articulation point, and a lower end of the lever arm is hingedly connected to the fixing base via a third point of articulation.
    More preferably, when one of the clamps presses a conductor of the cable against the corresponding conductive contact, the first, second and third points of articulation are arranged on the same straight line.
    In comparison with the prior art, the present invention has significant advantages: firstly, the present invention adopts a separation seat having a polyhedral structure, which makes it possible to allocate the plurality of pairs of cores to be tested to each side of the separation seat to establish connection with the cable test system, so as to simultaneously perform a test on the plurality of pairs of cores; secondly, since each pair of cores is located on a different side of the separation seat, as such, each pair of cores maintains a relative state of focus on the separation seat, and each clamp may still have sufficient storage space in the periphery of the separation seat so that during wiring in the present invention there is no need for a very long stripped length, shortening the stripping length being beneficial for improving the test frequency; third and particularly advantageously, an inclined separation channel is provided between the upper surface and the side of the separation seat of the present invention, which makes it possible to shorten the stripping length on the one hand, and to prevent bending vertical of the nucleus, on the other hand. Therefore, the present invention reduces damage to the cable structure during wiring and allows the test frequency to be increased considerably. As an example, according to the present invention, the cable test frequency can be increased above 2.4 GHz.
    Fig. 1 is a structural diagram of the first embodiment of a test platform for a high frequency cable according to the present invention.
    Fig. 2 is a perspective diagram of a test platform with four clamps according to the present invention.
    Fig. 3 is a perspective view of a separation seat of the first embodiment according to the present invention.
    Fig. 4 is a top view of a separation seat of the first embodiment according to the present invention.
    Fig. 5 is a structural diagram of a collet according to the present invention.
    Fig. 6 is a perspective view of the collet according to the present invention.
    Fig. 7 is a structural diagram of the second embodiment of a test platform according to the present invention.
    Below, the detailed description of the present invention will be illustrated in detail with reference to the figures. These embodiments are simply used to describe the present invention without limitation.
    In the description of the invention, it should be noted that the orientation indicated or the position relation, for example the terms "center", "top", "bottom", "upper" "lower", "Vertical", "horizontal", "inside", "outside", etc., are based on the orientation indicated or on the position relation as shown in the figures, and are simply used to facilitate the description and for the sake of simplicity , but not to indicate or imply the specific orientation of the device or the means constituting it, nor the orientation or the orientation configured specifically, and should therefore not be interpreted as a limitation of the present invention. Furthermore, the ordinal numbers of "first", "second", etc., are simply used to facilitate description, and should not be interpreted to indicate or imply relative importance. In the description of the invention, unless otherwise indicated, "a plurality of" means two or more than two.
    As shown in fig. 1, a test platform for a high frequency cable according to the present invention comprises a separation seat 1, which includes an upper surface 10 and a plurality of varied sides 11, 12, the upper surface 10 of the present embodiment is a horizontal plane, and the sides 11,12 are vertical planes which are perpendicular to the upper surface. The separation seat 1 is furthermore provided with separation channels 13, which are connected at an angle to the upper surface 10 and two sides 11, 12. Each side 11, 12 is provided with a conductive contact 30, respectively, and the separation seat 1 is provided with a plurality of clamps 2 located opposite the conductive contacts 30 on the periphery.
    When the conductive contacts are placed on the sides 11, 12, and below the upper surface 10 of the separation seat, each separation channel 13 is inclined outward and downward from the upper surface 10.
    Before wiring, 20 mm of an external protective sheath and a shielding layer are removed at one end of the cable to be tested, to expose the cores 41, 42, which are generally in pairs, namely, the core 41 which has a
    CH 710 587 B1 twisted wire composed of two wires, and the core 42 which contains a wire composed of two wires twisted together, then an insulating layer at the end of the cores 41,42 is stripped, in order to expose the conductor.
    As shown in fig. 1, during wiring, the stripped cable to be tested 4 is inserted into the test platform along the vertical direction at the upper surface 10 of the separation seat, to separate the cores, so that each pair of cores 41, 42 is located in a separation channel 13, respectively, and extends downward along the separation channel 13 on each side 11, 12. It can be seen that, in the present embodiment, due to the existence of the separation channel 13, each pair of cores 41, 42 can engage its rear end with each side 11, 12, by means of two relative progressive curvatures, such a mode of connection involves relatively little damage to the structure of cable itself. As the clamps 2 are used to press the stripped conductor at the rear end of each core against the conductive contact 30, to form an electrical connection, and that two ends of the cable to be tested 4 are connected to each pair of cores, it is thus possible to test them by the cable test system. In order to avoid interference from external signals, the separation seat 1 can be covered by a screened cover 6 (as shown in fig. 2), and the center of the screened cover 6 is provided with a through hole 60 through which the cable enters.
    As shown in figs. 2 and 4, the cable to be tested contains four pairs of cores, the upper surface 10 of the separation seat forms a square, and the four lines of the square extend downward and are extended by four separation channels 13. The parts lower of the four separation channels 13 are connected with the four sides, so that the four pairs of cores are symmetrically distributed at the four sides of the separation seat along the four separation channels 13. As the cable to be tested contains N pairs of cores, the upper surface 10 of the separation seat is a regular polygon with N sides, and the number of sides 11, 12 and separation channels 13 is also equal to N. In order to shorten the stripped length of the cable, it is preferable that an inscribed circle of the regular polygon constituting the upper surface 10 has a smaller diameter than that of the cable.
    As shown in fig. 3, each side of the separation seat 1 is fixed with a printed circuit board 3, the above conductive contacts are arranged on the printed circuit 3, and the outside of the printed circuit 3 is shielded by shielding plates 5.
    The clamp 2 acts so as to press the exposed conductor at the rear end of each core against the conductive contact. There are several ways to achieve this pressing function for those skilled in the art. The present invention further provides a preferred structure of the clamp 2. As shown in Figs. 5 and 6, the clamp 2 comprises a fixing base 20 and a slide 24 which can slide linearly in the fixing base, a front end of the sliding element 24 is provided with a clamping surface 25 opposite the conductive contact, a rear end of the slide 24 is hingedly connected to a front end of a connecting element 26 by means of a first point 21 of articulation, the rear end of the connecting element 26 is connected articulated to a middle part of a lever arm 27 via a second articulation point 22, and a lower end of the lever arm 27 is hingedly connected to the fixing base 20 by l 'through a third point 23 of articulation. By manually pushing an upper end of the lever arm 27 forward, the slider 24 is also driven so that the stripped conductor at the rear end of each core is pressed against the conductive contact. This clamp is very simple and effective in operation. Preferably, when the clamp 2 presses the cable conductor against the conductive contact, the first point 21 of articulation, the second point 22 of articulation and the third point 23 of articulation are situated exactly on the same straight line, thereby achieving self-locking and the clamp is held without loosening.
    [0024] FIG. 7 shows a structural diagram of a second embodiment of a test platform for a high frequency cable according to the present invention. Unlike the structure as shown in fig. 1, in the present embodiment, each respective side 11, 12 of the separation seat 1 is an inclined face, and each side 11, 12 has a direction of inclination corresponding to that of each separation channel 13 and extends towards the bottom from the lower end of each separation channel 13. As a result, the cores 41, 42 extend from the separation channel 13 on each side 11, 12, without bending being necessary. Therefore, each pair of cores 41,42 only needs one bend when entering the separation channel 13, thereby reducing damage to the cable structure and further reducing the stripped length of the cable. In order to better press the cable conductor against the inclined face, a pressure surface 25 at the front end of each clamp 2 is also configured as an inclined surface. The other structure is identical to the first embodiment shown in fig. 1.
    The above are preferred embodiments of the present invention, it should be noted that, for those skilled in the art and without departing from the technical principle of the present invention, several improvements or substitutions can also be performed which should also be considered to be within the scope of protection of the present invention as claimed in the claims which follow.
    权利要求:
    Claims (8)
    [1]
    claims
    1. Test platform for high frequency cable, comprising conductive contacts (30) and corresponding clamps (2) for pressing each conductor of the cable against one of the corresponding conductive contacts (30), characterized in that, the test platform further includes a separation seat (1), which includes a sur4
    CH 710 587 B1 upper face (10) and a plurality of various sides (11, 12), the conductive contacts (30) are respectively arranged on the sides (11, 12), the clamps (2) are arranged on the periphery of the separation seat (1) and are each opposite a corresponding conductive contact (30), the separation seat (1) is further provided with separation channels (13), and each separation channel (13) obliquely connects the surface upper (10) to a corresponding side (11, 12).
    [2]
    2. Test platform according to claim 1, characterized in that each conductive contact (30) is arranged below the upper surface (10) of the separation seat, each separation channel (13) being inclined towards the outside and down from the upper surface (10).
    [3]
    3. Test platform according to claim 1, characterized in that the upper surface (10) of the separation seat is a regular polygon, and that an inscribed circle of this regular polygon has a smaller diameter than that of the cable .
    [4]
    4. Test platform according to claim 1, characterized in that each respective side (11, 12) of the separation seat (1) is perpendicular to the upper surface (10).
    [5]
    5. Test platform according to claim 1, characterized in that each respective side (11, 12) of the separation seat (1) is an inclined face, and in that the direction of inclination on each side (11 , 12) corresponds to that of each corresponding separation channel (13).
    [6]
    6. Test platform according to claim 1, characterized in that the separation seat (1) is covered on top by a shielding box (6), and in that a center of the shielding box (6 ) is provided with a through hole (60) into which the cable penetrates.
    [7]
    7. Test platform according to claim 1, characterized in that each clamp (2) comprises a fixing seat (20) and a slide (24) which can slide linearly in the fixing housing (20), a front end of the slide (24) being provided with a clamping surface (25) opposite the corresponding conductive contact (30), a rear end of the slide (24) being hingedly connected to a front end of a connecting element (26 ) by means of a first articulation point (21), the rear connection end (26) being hingedly connected to a middle part of a lever arm (27) by means of a second articulation point (22), and a lower end of the lever arm (27) being hingedly connected to the fixing seat (20) via a third articulation point (23).
    [8]
    8. Test platform according to claim 7, characterized in that when one of the clamps (2) presses the cable conductor against the corresponding conductive contact (30), the first point of articulation (21), the second articulation point (22) and the third articulation point (23) are positioned on the same straight line.
    CH 710 587 B1
    类似技术:
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    EP0099384A1|1984-02-01|Flat electric connector with three pins.
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    引用文献:
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    CN204116396U|2014-10-30|2015-01-21|上海电缆研究所|High frequency cable test platform|CN108627712B|2017-03-17|2021-02-02|泰科电子有限公司|Carrier tool|
    法律状态:
    优先权:
    申请号 | 申请日 | 专利标题
    CN201410603883.5A|CN105628981B|2014-10-30|2014-10-30|High frequency cable test platform|
    PCT/CN2014/095898|WO2016065723A1|2014-10-30|2014-12-31|High frequency cable testing platform|
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